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  • Dual Source High Resistance Meter, Model 6650A

    • Replaces Teraohmmeter/Electrometer Technology
    • Range 100kΩ to 10PΩ
    • Automatic Scanner Control
    • Any Ratio up to 100:1
    • Live Ratio or Direct Measurement Mode
    • Voltage and Current Measurements
    • Surface and Volume Resistivity Measurements
    • 1V to 1000V Variable Voltage Output

  • Series of Primary High Value 2 Terminal Resistors
    from 100M to 100T with Optional Carrying Case

    • Based on NIST design
    • High stability
    • 100MΩ to 100TΩ
    • Split guard circuit
    • Internal temperature sensor
    • Custom values available

  • High Resistance Matrix Scanners

    • 10 or 20 Two Terminal Channels
    • N-Type Connections
    • Front Panel or Remote Operation
    • Maximum 1000V DC
    • Resistance Measurements to 10P
    • Insulation Resistance 1016 Ω

  • Automatic Temperature Secondary Bridge - 13:1 Ratio

    • 0.01Ω to 100kΩ range
    • Front Panel 6 Channel Scanner
    • Keep Warm Currents
    • Accuracy: < 10 x 10-8
    • Linearity < 5 x 10-9
    • IEEE488 and manual operation
    • AccuTcal™ Software for calibrating PRTs

MI-Europe is a technical support branch of MINTL Canada  Find out more        Looking for a complete product offer? Visit   Mintl.com

News Ticker

International Metrology Congress Invitation 2017

Measure, analyse and innovate: an on-going challenge!



The CIM 2017, International Metrology Congress, will be held, from 19 to 21 September in Paris (France). 

The CIM is a unique crossroads between R&D and industrial applications for all actors and all fields: industrial end- users of measurement equipments, technical experts, public and private laboratories, manufacturers and service providers. 

The Congress allows to:


  • improve your measurement, analysis and test processes, whilst reducing any inherent risks
  • explore evolutions in techniques, R&D progress and learn more about practical industrial applications

 

The major topics are: metrology 4.0 and factory of the future, new ISO 17 025, metrology for biology, health and pharmaceutics, new developments in energy, nanotechnologies ... 

The CIM 2017 is co-organised with ENOVA Paris, the reference exhibition for technologies in Electronic, IoT, Measurement, Vision and Optic.

More information: www.cim2017.com

Recent Documents

  • MI-Europe was established in 2005 as a Sales and Technical support office of Measurements International, Canada for better support of local sales representatives in European area
  • It is mainly intended as a European support office offering easier access to support in case of system configurations, installations, training, basic troubleshooting, as well as central distribution point for deliveries of MI equipment to customers throughout Europe
  • Local support in Europe provided by MI-Europe is built on years of mutual cooperation (started in 1996) between MIL and Roman Honig
  • Roman Honig participates in various installations, support and maintenance of MIL equipment in Europe and has been taking annual training at MIL Canada since 2003 to keep the ability of providing such support
  • Roman Honig graduated from Technical University (CZ) in 1987, has 4 years of experience working at accredited metrology laboratory and more than 20 years of experience in technical support of top metrology equipment used on Primary and National level of laboratories